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 About
Our Group |
Our
Research Facilities |
| What
Is Ion Beam Analysis? |
Who
Can Use The Facilities? |
|
Present Research Topics |
Other Research |
| Engineering
Physics Program |
Faculty and Student Home Pages |
| Student Projects |
Publications |
| Accelerator
Laboratory Web Sites |
Electronic
Materials Web Sites |
| Texas Consortuim
For Electronic Materials |
Office
of Sponsored Projects |
| Texas
A&M University |
Texas
A&M System |
| Physics
Journals Online (Science Direct) |
National
Science Foundation (FastTrack) |
| Materials
Research Society |
Texas
Engineering Expirement Station |
| Research Funding Provided Under The Following Grants |
| National Science Foundation Grant #DMR-0210162: Ion and Radical Beam Tailored Oxide, Nitride, and Germanide Electronic Film Materials |
| National Science Foundation Grant #DMR-0216571: High Sensitivity Profiling of Hydrogen and Nitrogen Using Nuclear Reaction Analysis |
| 2002 Tarleton Organized Research Grant: |
| 2003 Tarleton Organized Research Grant: |
| Research Corporation Grant#CC5064:High Sensitivity Detection of Hydrogen in Wide Band Gap Semiconductors Using Nuclear Reaction Analy. |